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Progress towards defect-free EUV reticles for NXE:3100
Publication:
Progress towards defect-free EUV reticles for NXE:3100
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Date
2011
Proceedings Paper
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22898.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jonckheere, Rik
;
Van Den Heuvel, Dieter
;
Hermans, Jan
;
Hendrickx, Eric
Journal
Abstract
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1823
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Acq. date: 2025-12-16
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Metrics
Views
1823
since deposited on 2021-10-19
1
last month
Acq. date: 2025-12-16
Citations