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Integration of TSVs, wafer thinning and backside passivation on full 300mm CMOS wafers for 3D applications
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Integration of TSVs, wafer thinning and backside passivation on full 300mm CMOS wafers for 3D applications
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Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jourdain, Anne
;
Buisson, Thibault
;
Phommahaxay, Alain
;
Redolfi, Augusto
;
Thangaraju, Sarasvathi
;
Travaly, Youssef
;
Beyne, Eric
;
Swinnen, Bart
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1976
since deposited on 2021-10-19
4
last month
1
last week
Acq. date: 2026-01-10
Citations
Metrics
Views
1976
since deposited on 2021-10-19
4
last month
1
last week
Acq. date: 2026-01-10
Citations