Authors

Khan, Seyab; Haron, Nor Zaidi; Hamdioui, Said; Catthoor, Francky

Conference

IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - DFT

Title

NBTI monitoring and design for reliability in nanoscale circuits

Publication type

Proceedings paper

Embargo date

9999-12-31