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NBTI monitoring and design for reliability in nanoscale circuits

dc.contributor.authorKhan, Seyab
dc.contributor.authorHaron, Nor Zaidi
dc.contributor.authorHamdioui, Said
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-19T14:48:17Z
dc.date.available2021-10-19T14:48:17Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19170
dc.sourceIIOimport
dc.titleNBTI monitoring and design for reliability in nanoscale circuits
dc.typeProceedings paper
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage68
dc.source.endpage76
dc.source.conferenceIEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - DFT
dc.source.conferencedate5/10/2011
dc.source.conferencelocationVancouver, BC Canada
imec.availabilityPublished - open access


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