Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs
Publication:
Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs
Date
2011
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kilchytska, V.
;
Alvarado, J.
;
Collaert, Nadine
;
Rooyackers, Rita
;
Put, Sofie
;
Simoen, Eddy
;
Claeys, Cor
;
Flandre, D.
Journal
Solid-State Electronics
Abstract
Description
Metrics
Views
1959
since deposited on 2021-10-19
425
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1959
since deposited on 2021-10-19
425
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations