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Three dimensional compositional analysis of semiconductors with the Atom Probe
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Three dimensional compositional analysis of semiconductors with the Atom Probe
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2011-12
Dissertation
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24460.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Koelling, Sebastian
Journal
Abstract
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1996
since deposited on 2021-10-19
1
last month
Acq. date: 2025-12-18
Citations
Metrics
Views
1996
since deposited on 2021-10-19
1
last month
Acq. date: 2025-12-18
Citations