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Challenges and solutions for ESD protection in advanced logic and RF CMOS technologies

dc.contributor.authorLinten, Dimitri
dc.contributor.authorThijs, Steven
dc.contributor.authorRaczkowski, Kuba
dc.contributor.authorGriffoni, Alessio
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorSong, Ming-Hsiang
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-19T15:34:39Z
dc.date.available2021-10-19T15:34:39Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19308
dc.sourceIIOimport
dc.titleChallenges and solutions for ESD protection in advanced logic and RF CMOS technologies
dc.typeProceedings paper
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.source.peerreviewno
dc.source.conferenceTaiwan ESD and Reilability Conference
dc.source.conferencedate1/11/2011
dc.source.conferencelocationHsinchu Taiwan
imec.availabilityPublished - imec


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