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Status report of IEEE P1838 - Standard for test access architecture for three-dimensional stacked integrated circuits

dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorCron, Adam
dc.date.accessioned2021-10-19T16:04:00Z
dc.date.available2021-10-19T16:04:00Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19387
dc.sourceIIOimport
dc.titleStatus report of IEEE P1838 - Standard for test access architecture for three-dimensional stacked integrated circuits
dc.typeOral presentation
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewno
dc.source.conferenceIEEE International Test Conference - ITC
dc.source.conferencedate18/09/2011
dc.source.conferencelocationAnaheim, CA USA
imec.availabilityPublished - imec


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