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Automated design-for-test for 2.5D and 3D SICs
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Authors
Marinissen, Erik Jan
;
Konijnenburg, Mario
;
Deutsch, Sergej
;
Keller, Brion
;
Chickermane, Vivek
;
Mukherjee, Subhasish
;
Goel, Sandeep K.
ISSN
1526-1344
Issue
5
Journal
Chip Scale Review
Volume
?
Title
Automated design-for-test for 2.5D and 3D SICs
Publication type
Journal article
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