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Automated design-for-test for 2.5D and 3D SICs
Publication:
Automated design-for-test for 2.5D and 3D SICs
Date
2011-09
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
;
Konijnenburg, Mario
;
Deutsch, Sergej
;
Keller, Brion
;
Chickermane, Vivek
;
Mukherjee, Subhasish
;
Goel, Sandeep K.
Journal
Chip Scale Review
Abstract
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1922
since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations
Metrics
Views
1922
since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations