Publication:

Automated design-for-test for 2.5D and 3D SICs

Date

2011-09

Journal article

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Author(s)

Marinissen, Erik Jan

;

Konijnenburg, Mario

;

Deutsch, Sergej

;

;

Chickermane, Vivek

;

Mukherjee, Subhasish

;

Goel, Sandeep K.

Journal

Chip Scale Review

Metrics

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