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Electrical characterization of the metal-vanadium dioxide interface and implications for memory applications

dc.contributor.authorMartens, Koen
dc.contributor.authorRadu, Iuliana
dc.contributor.authorMertens, Sofie
dc.contributor.authorShi, Xiaoping
dc.contributor.authorSchaekers, Marc
dc.contributor.authorTielens, Hilde
dc.contributor.authorHuyghebaert, Cedric
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorJurczak, Gosia
dc.contributor.authorAfanasev, Valeri
dc.contributor.authorHeyns, Marc
dc.contributor.authorKittl, Jorge
dc.date.accessioned2021-10-19T16:06:47Z
dc.date.available2021-10-19T16:06:47Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19394
dc.sourceIIOimport
dc.titleElectrical characterization of the metal-vanadium dioxide interface and implications for memory applications
dc.typeOral presentation
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.imecauthorMertens, Sofie
dc.contributor.imecauthorSchaekers, Marc
dc.contributor.imecauthorTielens, Hilde
dc.contributor.imecauthorHuyghebaert, Cedric
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.contributor.orcidimecMertens, Sofie::0000-0002-1482-6730
dc.contributor.orcidimecSchaekers, Marc::0000-0002-1496-7816
dc.contributor.orcidimecHuyghebaert, Cedric::0000-0001-6043-7130
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.source.peerreviewno
dc.source.conference1st International Workshop on Resistive RAM
dc.source.conferencedate20/10/2011
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


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