Probabilistic defect occupancy model for NBTI

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Authors
Martin-Martinez, Javier; Kaczer, Ben; Toledano Luque, Maria; Rodriguez, Rosana; Nafria, Monserat; Aymerich, X.; Groeseneken, Guido
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
Probabilistic defect occupancy model for NBTI
Publication type
Proceedings paper
Embargo date
9999-12-31
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