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Probabilistic defect occupancy model for NBTI

dc.contributor.authorMartin-Martinez, Javier
dc.contributor.authorKaczer, Ben
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorRodriguez, Rosana
dc.contributor.authorNafria, Monserat
dc.contributor.authorAymerich, X.
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-19T16:08:32Z
dc.date.available2021-10-19T16:08:32Z
dc.date.issued2011-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19398
dc.sourceIIOimport
dc.titleProbabilistic defect occupancy model for NBTI
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage920
dc.source.endpage925
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate10/04/2011
dc.source.conferencelocationMonterey, CA USA
imec.availabilityPublished - open access
imec.internalnotesXT.4


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