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Active trap determination at the interface of Ge and In0.53Ga0.47As substrates with dielectric layers
Publication:
Active trap determination at the interface of Ge and In0.53Ga0.47As substrates with dielectric layers
Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Molle, A.
;
Baldovino, S.
;
Lamagna, L.
;
Spiga, S.
;
Lamperti, A.
;
Fanciulli, M.
;
Tsoutsou, D.
;
Golias, E.
;
dimoulas, A.
;
Brammertz, Guy
;
Merckling, Clement
;
Caymax, Matty
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1926
since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations
Metrics
Views
1926
since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations