Show simple item record

dc.contributor.authorOrzali, Tommaso
dc.contributor.authorWang, G.
dc.contributor.authorWaldron, Niamh
dc.contributor.authorMerckling, Clement
dc.contributor.authorRichard, Olivier
dc.contributor.authorBender, Hugo
dc.contributor.authorCaymax, Matty
dc.date.accessioned2021-10-19T16:58:17Z
dc.date.available2021-10-19T16:58:17Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19522
dc.sourceIIOimport
dc.titleIn-Situ HCl etching of InP in shallow-trench-isolated structures
dc.typeMeeting abstract
dc.contributor.imecauthorWaldron, Niamh
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage2153
dc.source.conference220th ECS Fall Meeting
dc.source.conferencedate9/10/2011
dc.source.conferencelocationBoston, MA USA
imec.availabilityPublished - open access
imec.internalnotesMA 2011-02


Files in this item

Thumbnail

This item appears in the following collection(s)

Show simple item record