dc.contributor.author | Pacco, Antoine | |
dc.contributor.author | Sebaai, Farid | |
dc.contributor.author | Suhard, Samuel | |
dc.contributor.author | Struyf, Herbert | |
dc.contributor.author | De Gendt, Stefan | |
dc.contributor.author | Vos, Rita | |
dc.contributor.author | Veloso, Anabela | |
dc.contributor.author | Mertens, Paul | |
dc.date.accessioned | 2021-10-19T17:01:46Z | |
dc.date.available | 2021-10-19T17:01:46Z | |
dc.date.issued | 2011-10 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19530 | |
dc.source | IIOimport | |
dc.title | Galvanic corrosion of PN junctions during the dielectric removal with HF for RMG transistors | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Pacco, Antoine | |
dc.contributor.imecauthor | Sebaai, Farid | |
dc.contributor.imecauthor | Suhard, Samuel | |
dc.contributor.imecauthor | Struyf, Herbert | |
dc.contributor.imecauthor | De Gendt, Stefan | |
dc.contributor.imecauthor | Vos, Rita | |
dc.contributor.imecauthor | Veloso, Anabela | |
dc.contributor.imecauthor | Mertens, Paul | |
dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 37 | |
dc.source.endpage | 43 | |
dc.source.conference | Semiconductor Cleaning Science and Technology 12 | |
dc.source.conferencedate | 9/10/2011 | |
dc.source.conferencelocation | Boston, MA USA | |
imec.availability | Published - imec | |
imec.internalnotes | ECS Transactions; Vol. 41, Issue 5 | |