dc.contributor.author | Ragnarsson, Lars-Ake | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Kauerauf, Thomas | |
dc.contributor.author | De Keersgieter, An | |
dc.contributor.author | Schram, Tom | |
dc.contributor.author | Rohr, Erika | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Jurczak, Gosia | |
dc.contributor.author | Hong, Sug-Hun | |
dc.contributor.author | Tseng, Joshua | |
dc.contributor.author | Wang, Wei-E | |
dc.contributor.author | Trojman, Lionel | |
dc.contributor.author | Bourdelle, Konstantin | |
dc.contributor.author | Nguyen, B-Y | |
dc.contributor.author | Absil, Philippe | |
dc.contributor.author | Hoffmann, Thomas Y. | |
dc.date.accessioned | 2021-10-19T17:52:50Z | |
dc.date.available | 2021-10-19T17:52:50Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19652 | |
dc.source | IIOimport | |
dc.title | On the origin of the mobility reduction in bulk-Si, UTBOX-FDSOI and SiGe devices with ultrathin-EOT dielectrics | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Ragnarsson, Lars-Ake | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | De Keersgieter, An | |
dc.contributor.imecauthor | Schram, Tom | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.contributor.imecauthor | Absil, Philippe | |
dc.contributor.orcidimec | Ragnarsson, Lars-Ake::0000-0003-1057-8140 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | De Keersgieter, An::0000-0002-5527-8582 | |
dc.contributor.orcidimec | Schram, Tom::0000-0003-1533-7055 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 116 | |
dc.source.endpage | 117 | |
dc.source.conference | International Symposium on VLSI Technology, Systems and Applications - VLSI-TSA | |
dc.source.conferencedate | 25/04/2011 | |
dc.source.conferencelocation | Hsinchu Taiwan | |
imec.availability | Published - imec | |