Publication:

On the origin of the mobility reduction in bulk-Si, UTBOX-FDSOI and SiGe devices with ultrathin-EOT dielectrics

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1886 since deposited on 2021-10-19
1last month
Acq. date: 2025-12-10

Citations

Metrics

Views

1886 since deposited on 2021-10-19
1last month
Acq. date: 2025-12-10

Citations