Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
On the origin of the mobility reduction in bulk-Si, UTBOX-FDSOI and SiGe devices with ultrathin-EOT dielectrics
Publication:
On the origin of the mobility reduction in bulk-Si, UTBOX-FDSOI and SiGe devices with ultrathin-EOT dielectrics
Date
2011
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ragnarsson, Lars-Ake
;
Mitard, Jerome
;
Kauerauf, Thomas
;
De Keersgieter, An
;
Schram, Tom
;
Rohr, Erika
;
Collaert, Nadine
;
Jurczak, Gosia
;
Hong, Sug-Hun
;
Tseng, Joshua
;
Wang, Wei-E
;
Trojman, Lionel
;
Bourdelle, Konstantin
;
Nguyen, B-Y
;
Absil, Philippe
;
Hoffmann, Thomas Y.
Journal
Abstract
Description
Metrics
Views
1883
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
1883
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations