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Depth-profiling of the elastic and optical properties of submicrometer thick optically transparent films by picosecond ultrasonics inteferometry

dc.contributor.authorRuello, P.
dc.contributor.authorLomonosov, A.
dc.contributor.authorAyouch, A.
dc.contributor.authorMechri, C.
dc.contributor.authorBaklanov, Mikhaïl
dc.contributor.authorVerdonck, Patrick
dc.contributor.authorZhao, Larry
dc.contributor.authorGusev, V.
dc.date.accessioned2021-10-19T18:20:01Z
dc.date.available2021-10-19T18:20:01Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19714
dc.sourceIIOimport
dc.titleDepth-profiling of the elastic and optical properties of submicrometer thick optically transparent films by picosecond ultrasonics inteferometry
dc.typeMeeting abstract
dc.contributor.imecauthorVerdonck, Patrick
dc.contributor.orcidimecVerdonck, Patrick::0000-0003-2454-0602
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage59
dc.source.conference5th Conference on Emerging Technologies in Non Destructive Testing ETNDT
dc.source.conferencedate19/09/2011
dc.source.conferencelocationIoannina Greece
imec.availabilityPublished - open access


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