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Depth-profiling of the elastic and optical properties of submicrometer thick optically transparent films by picosecond ultrasonics inteferometry
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Depth-profiling of the elastic and optical properties of submicrometer thick optically transparent films by picosecond ultrasonics inteferometry
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Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ruello, P.
;
Lomonosov, A.
;
Ayouch, A.
;
Mechri, C.
;
Baklanov, Mikhaïl
;
Verdonck, Patrick
;
Zhao, Larry
;
Gusev, V.
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1901
since deposited on 2021-10-19
Acq. date: 2025-12-10
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Views
1901
since deposited on 2021-10-19
Acq. date: 2025-12-10
Citations