Authors

Ruello, P.; Lomonosov, A.; Ayouch, A.; Mechri, C.; Baklanov, Mikhaïl; Verdonck, Patrick; Zhao, Larry; Gusev, V.

Conference

5th Conference on Emerging Technologies in Non Destructive Testing ETNDT

Title

Depth-profiling of the elastic and optical properties of submicrometer thick optically transparent films by picosecond ultrasonics inteferometry

Publication type

Meeting abstract

Embargo date

9999-12-31