Authors

Scalise, Emilio; Houssa, Michel; Pourtois, Geoffrey; Afanas'ev, Valery; Stesmans, Andre

ISSN

0003-6951

Issue

13

Journal

Applied Physics Letters

Volume

99

Title

Inelastic electron tunneling spectroscopy of HfO2 gate stacks: A study based on first-principles modeling

Publication type

Journal article

Embargo date

9999-12-31