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A deep-level transient spectroscopy study of implanted Ge p+n and n+p junctions by Pt-induced crystallization
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A deep-level transient spectroscopy study of implanted Ge p+n and n+p junctions by Pt-induced crystallization
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2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Lauwaert, J.
;
Vrielinck, H.
;
Ioannou-Sougleridis, V.
;
dimoulas, A.
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1938
since deposited on 2021-10-19
Acq. date: 2026-01-08
Citations
Metrics
Views
1938
since deposited on 2021-10-19
Acq. date: 2026-01-08
Citations