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Random telegraph noise: from a defect spectroscopic tool to a deep submicron CMOS circuit threat

dc.contributor.authorSimoen, Eddy
dc.contributor.authorLoo, Roger
dc.date.accessioned2021-10-19T18:54:05Z
dc.date.available2021-10-19T18:54:05Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19790
dc.sourceIIOimport
dc.titleRandom telegraph noise: from a defect spectroscopic tool to a deep submicron CMOS circuit threat
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorLoo, Roger
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.source.peerreviewno
dc.source.conferenceICNF Workshop and Tutorials on Selected Topics on Noise in Devices
dc.source.conferencedate12/06/2011
dc.source.conferencelocationToronto Canada
imec.availabilityPublished - imec


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