Authors

Srivastava, Puneet; Das, Jo; Visalli, Domenica; Van Hove, Marleen; Malinowski, Pawel; Marcon, Denis; Lenci, Silvia; Geens, Karen; Cheng, Kai; Leys, Maarten; Decoutere, Stefaan; Mertens, Robert; Borghs, Gustaaf

ISSN

0741-3106

Issue

1

Journal

IEEE Electron Device Letters

Volume

32

Title

Record breakdown voltage (2200 V) of GaN DHFETs on Si with 2-μm buffer thickness by local substrate removal

Publication type

Journal article