Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Wafer probing on fine-pitch micro-bumps for 2.5D- and 3D-SICs
Publication:
Wafer probing on fine-pitch micro-bumps for 2.5D- and 3D-SICs
Date
2011-10
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Thaerigen, Thomas
;
Kanev, Stojan
;
Kiesewetter, Joerg
;
Hanaway, Peter
;
Strid, Eric
;
Marinissen, Erik Jan
;
Dupas, Luc
Journal
Abstract
Description
Metrics
Views
1920
since deposited on 2021-10-19
Acq. date: 2025-10-27
Citations
Metrics
Views
1920
since deposited on 2021-10-19
Acq. date: 2025-10-27
Citations