Carrier lifetime studies in diode structures on Si substrates with and without Ge doping

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Authors

Uleckas, A.; Gaubas, E.; Rafi, J.M.; Chen, J.; Yang, D.; Ohyama, H.; Simoen, Eddy; Vanhellemont, J.

ISSN

1662-9779

Journal

Solid State Phenomena

Volume

178-179

Title

Carrier lifetime studies in diode structures on Si substrates with and without Ge doping

Publication type

Journal article

Embargo date

9999-12-31

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