Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Process optimization enabled by novel quantitative pattern collapse metrology
Publication:
Process optimization enabled by novel quantitative pattern collapse metrology
Date
2011
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
23902.pdf
547.29 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Winroth, Gustaf
;
Gronheid, Roel
Journal
Abstract
Description
Metrics
Views
1887
since deposited on 2021-10-19
406
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1887
since deposited on 2021-10-19
406
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations