dc.contributor.author | Yamaguchi, Shinpei | |
dc.contributor.author | Witters, Liesbeth | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Hellings, Geert | |
dc.contributor.author | Fukuda, Masahiro | |
dc.contributor.author | Hikavyy, Andriy | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Veloso, Anabela | |
dc.contributor.author | Crabbe, Yvo | |
dc.contributor.author | Rohr, Erika | |
dc.contributor.author | Favia, Paola | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Takeoka, S. | |
dc.contributor.author | Vellianitis, Georgios | |
dc.contributor.author | Wang, Wei-E | |
dc.contributor.author | Ragnarsson, Lars-Ake | |
dc.contributor.author | De Meyer, Kristin | |
dc.contributor.author | Steegen, An | |
dc.contributor.author | Horiguchi, Naoto | |
dc.date.accessioned | 2021-10-19T21:59:48Z | |
dc.date.available | 2021-10-19T21:59:48Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20169 | |
dc.source | IIOimport | |
dc.title | High performance Si.45Ge.55 implant free quantum well FET featuring low temperature process, eSiGe stressor and transversal strain relaxation | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Witters, Liesbeth | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | Hellings, Geert | |
dc.contributor.imecauthor | Hikavyy, Andriy | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Veloso, Anabela | |
dc.contributor.imecauthor | Favia, Paola | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | Vellianitis, Georgios | |
dc.contributor.imecauthor | Ragnarsson, Lars-Ake | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
dc.contributor.orcidimec | Hikavyy, Andriy::0000-0002-8201-075X | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Favia, Paola::0000-0002-1019-3497 | |
dc.contributor.orcidimec | Ragnarsson, Lars-Ake::0000-0003-1057-8140 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 829 | |
dc.source.endpage | 832 | |
dc.source.conference | IEEE International Electron Devices Meeting - IEDM | |
dc.source.conferencedate | 5/12/2011 | |
dc.source.conferencelocation | Washington, DC USA | |
imec.availability | Published - open access | |