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Efficient sensitivity-based capacitance modeling for systematic and random geometric variations

dc.contributor.authorYu, Bi
dc.contributor.authorHarpe, Pieter
dc.contributor.authorvan der Meijs, N.P.
dc.date.accessioned2021-10-19T22:07:22Z
dc.date.available2021-10-19T22:07:22Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20184
dc.sourceIIOimport
dc.titleEfficient sensitivity-based capacitance modeling for systematic and random geometric variations
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage61
dc.source.endpage66
dc.source.conference16th Asia and Sout Pacific Design Automation Conference - ASP-DAC
dc.source.conferencedate25/01/2011
dc.source.conferencelocationYokohama Japan
imec.availabilityPublished - open access


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