Publication:

Effect of ionizing radiation on defects and 1/f noise in Ge pMOSFETs

Date

2011

Journal article

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Files

22837.pdf 628.95 KB

Author(s)

Zhang, Cher Xuang

;

Francis, Sarah Ashley

;

;

Fleetwood, Daniel M.

;

Schrimpf, Ronald D.

;

Galloway, Kenneth F.

;

;

;

Journal

IEEE Transactions on Nuclear Science

Metrics

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Acq. date: 2025-12-10