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Variability assessment of 13nm bulk-planar vs fully depleted FinFET SRAM
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Authors
Zuber, Paul
;
Buchegger, Peter
;
Dobrovolny, Petr
;
Miranda Corbalan, Miguel
Conference
1st TRAMS Workshop
Title
Variability assessment of 13nm bulk-planar vs fully depleted FinFET SRAM
Publication type
Oral presentation
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