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Variability assessment of 13nm bulk-planar vs fully depleted FinFET SRAM

dc.contributor.authorZuber, Paul
dc.contributor.authorBuchegger, Peter
dc.contributor.authorDobrovolny, Petr
dc.contributor.authorMiranda Corbalan, Miguel
dc.date.accessioned2021-10-19T22:35:01Z
dc.date.available2021-10-19T22:35:01Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20237
dc.sourceIIOimport
dc.titleVariability assessment of 13nm bulk-planar vs fully depleted FinFET SRAM
dc.typeOral presentation
dc.contributor.imecauthorZuber, Paul
dc.contributor.imecauthorDobrovolny, Petr
dc.contributor.orcidimecDobrovolny, Petr::0000-0002-1465-481X
dc.source.peerreviewno
dc.source.conference1st TRAMS Workshop
dc.source.conferencedate8/09/2011
dc.source.conferencelocationGlasgow UK
imec.availabilityPublished - imec


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