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Statistical characterization of a high-K metal gate 32nm ARM926 core under process variability impact

dc.contributor.authorZuber, Paul
dc.contributor.authorDobrovolny, Petr
dc.contributor.authorLaabidi, Selma
dc.contributor.authorJaverliac, Virgile
dc.contributor.authorLaplanche, Yves
dc.contributor.authorMiranda Corbalan, Miguel
dc.date.accessioned2021-10-19T22:35:32Z
dc.date.available2021-10-19T22:35:32Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20238
dc.sourceIIOimport
dc.titleStatistical characterization of a high-K metal gate 32nm ARM926 core under process variability impact
dc.typeOral presentation
dc.contributor.imecauthorZuber, Paul
dc.contributor.imecauthorDobrovolny, Petr
dc.contributor.orcidimecDobrovolny, Petr::0000-0002-1465-481X
dc.source.peerreviewno
dc.source.conferenceDesign Automation Conference - DAC. User Track
dc.source.conferencedate4/06/2011
dc.source.conferencelocationSan Diego, CA USA
imec.availabilityPublished - imec


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