Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Characterization of chemically vapor deposited manganese barrier layers using X-ray absorption fine structure
Publication:
Characterization of chemically vapor deposited manganese barrier layers using X-ray absorption fine structure
Copy permalink
Date
2012
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ablett, James
;
Wilson, Chris
;
Phuong, Nguyen Mai
;
Koike, Junichi
;
Tokei, Zsolt
;
Sterbinsky, George
;
Woicik, Joseph
Journal
Japanese Journal of Applied Physics
Abstract
Description
Metrics
Views
1902
since deposited on 2021-10-20
2
last month
Acq. date: 2025-12-13
Citations
Metrics
Views
1902
since deposited on 2021-10-20
2
last month
Acq. date: 2025-12-13
Citations