Publication:
Characterizing oxide traps in the InGaAs/Al2O3 system with sulfur passivation
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1867 since deposited on 2021-10-20
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Acq. date: 2026-01-09
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Views
1867 since deposited on 2021-10-20
1last month
1last week
Acq. date: 2026-01-09
Citations