Authors

Almeida, Luciano M.; Sasaki, Katia R.A.; Aoulaiche, Marc; Collaert, Nadine; Simoen, Eddy; Claeys, Cor; Martino, Joao A.; Jurczak, Gosia

Conference

8th European Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI

Title

The dependence of sense margin and retention time on front and back gate bias in UTBOX FBRAM

Publication type

Proceedings paper

Embargo date

9999-12-31