Show simple item record

The dependence of sense margin and retention time on front and back gate bias in UTBOX FBRAM

dc.contributor.authorAlmeida, Luciano M.
dc.contributor.authorSasaki, Katia R.A.
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorCollaert, Nadine
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorMartino, Joao A.
dc.contributor.authorJurczak, Gosia
dc.date.accessioned2021-10-20T10:01:28Z
dc.date.available2021-10-20T10:01:28Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20280
dc.sourceIIOimport
dc.titleThe dependence of sense margin and retention time on front and back gate bias in UTBOX FBRAM
dc.typeProceedings paper
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage23
dc.source.endpage24
dc.source.conference8th European Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI
dc.source.conferencedate24/01/2012
dc.source.conferencelocationMontpellier France
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
24363.pdf
Size:
203.4Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record