Publication:
Reliability in gate first and gate last Ultra-Thin-EOT gate stacks assessed with CV-eMSM BTI characterization
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1851 since deposited on 2021-10-20
Acq. date: 2025-12-17
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Metrics
Views
1851 since deposited on 2021-10-20
Acq. date: 2025-12-17
Citations