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Development of a SEM based methodology for the detection of sub-surface voids in nano-interconnects
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Development of a SEM based methodology for the detection of sub-surface voids in nano-interconnects
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Carbonell, Laure
;
Caluwaerts, Rudy
;
Heylen, Nancy
;
Volders, Henny
;
Kellens, Kristof
;
Tokei, Zsolt
;
Takada, S
;
Ban, N
;
Ishimoto, T
;
Suzuki, N.
;
Umehara, S.
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Metrics
Views
1890
since deposited on 2021-10-20
2
last month
1
last week
Acq. date: 2026-01-07
Citations