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Conference contributions
Hf cap thickness dependence in bipolar-switching TiN\HfO2\Hf\TiN RRAM device
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Hf cap thickness dependence in bipolar-switching TiN\HfO2\Hf\TiN RRAM device
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chen, Yangyin
;
Pourtois, Geoffrey
;
Clima, Sergiu
;
Govoreanu, Bogdan
;
Goux, Ludovic
;
Fantini, Andrea
;
Degraeve, Robin
;
Groeseneken, Guido
;
Wouters, Dirk
;
Jurczak, Gosia
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1807
since deposited on 2021-10-20
Acq. date: 2025-12-18
Citations
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Views
1807
since deposited on 2021-10-20
Acq. date: 2025-12-18
Citations