Insight into negative and positive bias temperature instability (N/PBTI) mechanism

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Authors

Cho, Moon Ju; Lee, Jae-Duk; Aoulaiche, Marc; Kaczer, Ben; Roussel, Philippe; Kauerauf, Thomas; Degraeve, Robin; Franco, Jacopo; Ragnarsson, Lars-Ake; Groeseneken, Guido

ISSN

0018-9383

Issue

8

Journal

IEEE Transactions on Electron Devices

Volume

59

Title

Insight into negative and positive bias temperature instability (N/PBTI) mechanism

Publication type

Journal article

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