dc.contributor.author | Civale, Yann | |
dc.contributor.author | Redolfi, Augusto | |
dc.contributor.author | Jaenen, Patrick | |
dc.contributor.author | Kostermans, Maarten | |
dc.contributor.author | Van Besien, Els | |
dc.contributor.author | Mertens, Sofie | |
dc.contributor.author | Witters, Thomas | |
dc.contributor.author | Jourdan, Nicolas | |
dc.contributor.author | Armini, Silvia | |
dc.contributor.author | Vandersmissen, Kevin | |
dc.contributor.author | Philipsen, Harold | |
dc.contributor.author | Verdonck, Patrick | |
dc.contributor.author | Heylen, Nancy | |
dc.contributor.author | Nolmans, Philip | |
dc.contributor.author | Li, Yunlong | |
dc.contributor.author | Croes, Kristof | |
dc.contributor.author | Beyer, Gerald | |
dc.contributor.author | Swinnen, Bart | |
dc.contributor.author | Beyne, Eric | |
dc.date.accessioned | 2021-10-20T10:18:49Z | |
dc.date.available | 2021-10-20T10:18:49Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20468 | |
dc.source | IIOimport | |
dc.title | Through-silicon via technology for three-dimensional integrated circuit manufacturing | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Redolfi, Augusto | |
dc.contributor.imecauthor | Jaenen, Patrick | |
dc.contributor.imecauthor | Van Besien, Els | |
dc.contributor.imecauthor | Mertens, Sofie | |
dc.contributor.imecauthor | Witters, Thomas | |
dc.contributor.imecauthor | Jourdan, Nicolas | |
dc.contributor.imecauthor | Armini, Silvia | |
dc.contributor.imecauthor | Vandersmissen, Kevin | |
dc.contributor.imecauthor | Philipsen, Harold | |
dc.contributor.imecauthor | Verdonck, Patrick | |
dc.contributor.imecauthor | Heylen, Nancy | |
dc.contributor.imecauthor | Nolmans, Philip | |
dc.contributor.imecauthor | Li, Yunlong | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.imecauthor | Beyer, Gerald | |
dc.contributor.imecauthor | Swinnen, Bart | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Van Besien, Els::0000-0002-5174-2229 | |
dc.contributor.orcidimec | Mertens, Sofie::0000-0002-1482-6730 | |
dc.contributor.orcidimec | Armini, Silvia::0000-0003-0578-3422 | |
dc.contributor.orcidimec | Philipsen, Harold::0000-0002-5029-1104 | |
dc.contributor.orcidimec | Verdonck, Patrick::0000-0003-2454-0602 | |
dc.contributor.orcidimec | Li, Yunlong::0000-0003-4791-4013 | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.source.peerreview | yes | |
dc.source.conference | 35th International Electronics Manufacturing Technology Conference - IEMT | |
dc.source.conferencedate | 6/11/2012 | |
dc.source.conferencelocation | Ipoh Malaysia | |
imec.availability | Published - imec | |