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Reliability concerns in copper TSV's: methods and results
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Authors
Croes, Kristof
;
Cherman, Vladimir
;
Li, Yunlong
;
Zhao, Larry
;
Barbarin, Yohan
;
De Messemaeker, Joke
;
Civale, Yann
;
Velenis, Dimitrios
;
Stucchi, Michele
;
Kauerauf, Thomas
;
Redolfi, Augusto
;
Dimcic, Biljana
;
Ivankovic, Andrej
;
Van der Plas, Geert
;
De Wolf, Ingrid
;
Beyer, Gerald
;
Swinnen, Bart
;
Tokei, Zsolt
;
Beyne, Eric
Conference
19th International Symposium on the Physical & Failure Analysis of Integrated Circuits - IPFA
Title
Reliability concerns in copper TSV's: methods and results
Publication type
Proceedings paper
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