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Low-frequency noise behaviour of bulk and DTMOS triple-gate devices under 60 MeV proton irradiation
Publication:
Low-frequency noise behaviour of bulk and DTMOS triple-gate devices under 60 MeV proton irradiation
Date
2012
Proceedings Paper
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24603.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
de Andrade, M.G.C.
;
Martino, J.A.
;
Aoulaiche, Marc
;
Collaert, Nadine
;
Simoen, Eddy
;
Claeys, Cor
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1907
since deposited on 2021-10-20
Acq. date: 2025-10-30
Citations
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Views
1907
since deposited on 2021-10-20
Acq. date: 2025-10-30
Citations