Exchange bias induced by O ion implantation in ferromagnetic thin films

View/open

25495.pdf (623.1Kb)

Metadata

Show full item record

Authors

Demeter, J.; Menendez, E.; Schrauwen, A.; Teichert, A.; Steitz, R.; Vandezande, S.; Wildes, A. R.; Vandervorst, Wilfried; Temst, K.; Vantomme, Andre

ISSN

0022-3727

Issue

40

Journal

Journal of Physics D: Applied Physics

Volume

45

Title

Exchange bias induced by O ion implantation in ferromagnetic thin films

Publication type

Journal article

Embargo date

9999-12-31

Collections

Articles