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Exchange bias induced by O ion implantation in ferromagnetic thin films
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Exchange bias induced by O ion implantation in ferromagnetic thin films
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Date
2012
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Demeter, J.
;
Menendez, E.
;
Schrauwen, A.
;
Teichert, A.
;
Steitz, R.
;
Vandezande, S.
;
Wildes, A. R.
;
Vandervorst, Wilfried
;
Temst, K.
;
Vantomme, Andre
Journal
Journal of Physics D: Applied Physics
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1944
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Acq. date: 2025-12-10
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Metrics
Views
1944
since deposited on 2021-10-20
1
last month
Acq. date: 2025-12-10
Citations