DfT insertion and interconnect test generation for 3D stacks with JEDEC wide-IO DRAM

Thumbnail
Metadata
Show full item record
Authors
Deutsch, Sergej; Keller, Brion; Chickermane, Vivek; Goel, Sandeep K.; Marinissen, Erik Jan
Conference
IEEE North-Atlantic Test Workshop - NATW
Title
DfT insertion and interconnect test generation for 3D stacks with JEDEC wide-IO DRAM
Publication type
Proceedings paper
Collections