Heavy-ion-induced current transients in bulk and SOI FinFETs

Simple item page Full metadata Statistics

Files

25159.pdf 868.22 KB

Author(s)

;

;

;

;

;

;

;

;

Fleetwood, D.M.

;

Linten, Dimitri

;

;

Journal

IEEE Transactions on Nuclear Science

Metrics

1946 since deposited on 2021-10-20

Acq. date: 2025-10-23