Toggle navigation
My submissions
Login
Toggle navigation
View item
imec Publications Repository
imec Publications
Conference contributions
View item
imec Publications Repository
imec Publications
Conference contributions
View item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Intrinsic switching behavior in HfO2 RRAM by fast electrical measurments on novel 2R test structures
View/
open
24767.pdf (2.226Mb)
Metadata
Show full item record
Authors
Fantini, Andrea
;
Wouters, Dirk
;
Degraeve, Robin
;
Goux, Ludovic
;
Pantisano, Luigi
;
Kar, Gouri Sankar
;
Chen, Yangyin
;
Govoreanu, Bogdan
;
Kittl, Jorge
;
Altimime, Laith
;
Jurczak, Gosia
Conference
4th IEEE International Memory Workshop - IMW
Title
Intrinsic switching behavior in HfO2 RRAM by fast electrical measurments on novel 2R test structures
Publication type
Proceedings paper
Embargo date
9999-12-31
Collections
Conference contributions
Search imec Publications Repository
This collection
Browse
All of imec Publications Repository
Collections
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
This collection
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
My account
login
NoThumbnail