dc.contributor.author | Fantini, Andrea | |
dc.contributor.author | Wouters, Dirk | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Goux, Ludovic | |
dc.contributor.author | Pantisano, Luigi | |
dc.contributor.author | Kar, Gouri Sankar | |
dc.contributor.author | Chen, Yangyin | |
dc.contributor.author | Govoreanu, Bogdan | |
dc.contributor.author | Kittl, Jorge | |
dc.contributor.author | Altimime, Laith | |
dc.contributor.author | Jurczak, Gosia | |
dc.date.accessioned | 2021-10-20T10:58:08Z | |
dc.date.available | 2021-10-20T10:58:08Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20668 | |
dc.source | IIOimport | |
dc.title | Intrinsic switching behavior in HfO2 RRAM by fast electrical measurments on novel 2R test structures | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Fantini, Andrea | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Goux, Ludovic | |
dc.contributor.imecauthor | Kar, Gouri Sankar | |
dc.contributor.imecauthor | Chen, Yangyin | |
dc.contributor.imecauthor | Govoreanu, Bogdan | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 45 | |
dc.source.endpage | 48 | |
dc.source.conference | 4th IEEE International Memory Workshop - IMW | |
dc.source.conferencedate | 21/04/2012 | |
dc.source.conferencelocation | Milano Italy | |
imec.availability | Published - open access | |