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Conference contributions
Characterization of Al/Ti and NiGe ohmic contacts to n-type GeSn CVD-grown layers
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Characterization of Al/Ti and NiGe ohmic contacts to n-type GeSn CVD-grown layers
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Date
2012
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24641.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Firrincieli, Andrea
;
Gupta, Suyog
;
Vincent, Benjamin
;
Gencarelli, Federica
;
Lin, Dennis
;
Simoen, Eddy
;
Vandervorst, Wilfried
;
Claeys, Cor
;
Saraswat, K.
;
Kittl, Jorge
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1903
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Views
1903
since deposited on 2021-10-20
2
last month
2
last week
Acq. date: 2026-01-12
Citations