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Conference contributions
Characterization of Al/Ti and NiGe ohmic contacts to n-type GeSn CVD-grown layers
Publication:
Characterization of Al/Ti and NiGe ohmic contacts to n-type GeSn CVD-grown layers
Date
2012
Meeting abstract
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24641.pdf
286.67 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Firrincieli, Andrea
;
Gupta, Suyog
;
Vincent, Benjamin
;
Gencarelli, Federica
;
Lin, Dennis
;
Simoen, Eddy
;
Vandervorst, Wilfried
;
Claeys, Cor
;
Saraswat, K.
;
Kittl, Jorge
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Abstract
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1901
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Citations
Metrics
Views
1901
since deposited on 2021-10-20
435
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations